Tutkimuslaitteistoista keskeisimpiä ovat elektronimikroanalyysi (EPMA), röntgen pulveridiffraktometri (XRD), kokokivianalyyseihin käytettävä aallonpituusdispersiivinen röntgenfluoresenssispektrometri (WD-XRF), infrapunaspektrometri (FT-IR), pyyhkäisyelektronimikroskooppi (SEM), fluidisulkeumalaboratorio, klastisten näytteiden raekokoanalysaattori (Malvern) ja joukko erilaisia näytteenkäsittelylaboratoroita (ohuthielaboratorio, näytemurskaus, jauhatus, seulonta, jne.)
Electron probe microanalyzer or "microprobe" is designed for non-destructive micrometer-sized spot quantitative chemical analysis from polished mineral sample surfaces. We are running a completely modernized Jeol JXA-8600 superprobe equipped with five wavelength dispersive X-ray detectors (WDS) and one energy dispersive X-ray detector (EDS).
Analysis detector and sample stage control electronics of this instrument were switched to PointElectronic SAMx hardware and Diss5/IDFix software in 2009. In addition, the whole electron gun control unit of the original instrument was replaced with PointElectronic digital control in spring 2013.
Instruments:
- EPMA JEOL JXA-8600 Superprobe with 5 WDS detectors and one Sirius SDD EDS detector, upgraded with SAMx hardware and XMAs/IDFix/Diss5 analytical software
- SEM JEOL JSM-T330, Oxford Si(Li) EDS detector, upgraded with XMAs/IDFix/Diss5 analytical software
Things to be done prior to contacting the laboratory
Contact information: Radoslaw Michallik
Instruments:
- XRD PANalytical X’Pert3 Powder, X-ray powder diffractometer
- XRF PANalytical Axios mAX 4 kW, X-ray fluorescence spectroscopy, wavelength dispersive spectrometer
Contact information: Tuija Vaahtojärvi
Instruments:
- LA-ICP-MS Coherent GeoLas MV 193 nm Laser, Agilent 7900s ICP mass spectrometer. Combined with a small volume sample cell the laboratory is tuned for measurement of fluid inclusions.
- Hot CL Lumic HC6-LM, Olympus DP73 camera, hot cathode cathodoluminescence microscopy
- Cold CL CITL analytical instruments CL 8200 Mk-2, Leica DM2700 P microscope, DFC450 C camera, cold cathode cathodoluminescence microscopy
- FI microscopes Linkam heating/cooling stage, Leica DM2500 P and BX51 IR-microscope / Leica DFC450 C camera, microthermometry
Thin sections, polished thin sections, fluid inclusion thick sections, and sample mounts in epoxy.
Hydraulic press, jaw crusher, wolfram carbide ball mill, Claisse M4 fluxer.
Grain size analysis: Malvern Mastersizer 2000 Grain size distribution of suspended sediment within the grain size range of 2-2000 µm.
Contact information: Seija Kultti