Electron Microscopes

JEOL JEM-1400 Transmission Electron Microscope

Location: Room 1413

Model: JEOL JEM-1400 (Jeol Ltd., Tokyo, Japan)
Resolution (Line), nm: 0.20 
Resolution (Point), nm: 0.38 
Filament: Tungsten
Voltage, kV: 40-120
Magnification: x50 - x800,000

Equipped with:

• Gatan Orius SC 1000B bottom mounted CCD-camera (Gatan Inc., USA)
• Resolution: 4008 x 2672 pixels (9 µ each)
• CCD active area: 36 x 24 mm
• Scintilator: High-resolution phosphor
• Binning: 1x, 2x, 3x, 4x
• Dynamic range: 14-bit
• Frame rate: 14 fps @ 4x binning full CCD area (1002 x 668 pixels) 30MHz dual port CCD readout

HITACHI HT7800 Transmission Electron Microscope

Location: Room 1407

Electron gun: Tungsten
Accelerating voltage: 20-120
Resolution: 0.204
Maximum magnification: x600 000

Main imaging camera

• Model: Gatan Rio 9 (model 1809) bottom-mounted CMOS camera
• Image size: 3072 x 3072 pixels
• Pixel size: 9 um

ZEISS Crossbeam 550 Field Emission Gun Scanning Electron Microscope equipped with Focus Ion Beam

Location: Room 1415

 with GEMINI II electron optics is optimized for fast high-resolution low-kV imaging. The microscope is equipped with Gallium - Focused Ion Beam (FIB) for 3D EM imaging. It features a large chamber (330 mm inner diameter, 270 mm height) with 18 configurable ports for optional accessories, auto pendulum anti vibration system, 6-axes motorized super-eucentric stage, a plasma cleaner and charge compensation system.

Detectors:

• In-chamber, Everhardt Thornley SE detector
• In-chamber, retractable aBSD1 detector for backscattered electrons
• In-Lens detectors for SE electrons
• In-Lens EsB detector for backscattered electrons
• Two in-chambers cameras
• Navigation camera

Applications:

• High resolution standard SEM imaging using low accelatating voltages
• Imaging of large fields of view with an advanced stitching module
• Imaging of poorly conductive specimens with low voltages or with the help of the charge compensation system
• Isotropic and anisotropic 3D EM imaging with resolutions up to 4 x 4 x 4 nm and 2.5 x 2.5 x 5.0 nm
• Large area imaging with automated stitching for Array-Tomography

ZEISS Gemini 460 Field Emission Gun Scanning Electron Microscope equipped with Volutome

Location: Room 1409

with GEMINI 2 electron optics is optimized for gentle, high-resolution low-kV imaging of beam-sensitive biological specimens. The microscope is equipped with the ultramicrotome with an integrated charge compensation system, enabling precise serial block-face sectioning for large-volume 3D electron microscopy of cells and tissues. 

It features a spacious chamber with multiple configurable ports, a fully motorized multi-axis stage for easy navigation across biological samples, low vacuum mode for stable imaging of non-conductive specimens, stage bias for better signal in array-tomography applications, and a plasma cleaner to maintain pristine imaging conditions. 

Users can choose between ZEN, SmartSEM, or Atlas software platforms for data collection and microscope manipulations.

Detectors:

• In-chamber, Everhardt Thornley SE detector
• In-chamber, retractable ZEISS VolumeBSD detector of backscattered electrons for low-kV imaging
• In-Lens detectors for SE electrons
• Two in-chambers cameras

Applications:

• High resolution standard SEM imaging using low acceletating voltages
• Serial block-face (SBF-SEM) large-volume 3D EM imaging of cells and tissues via precise sectioning with the Zeiss Volutome with resolutions up to 5x5x30 nm
• Imaging of poorly conductive biological samples using low vacuum mode
• Large area imaging with automated stitching for Array-Tomography (AT) or standard SEM