Electron Microscopes

Electron Microscopes.
Jeol JEM-1400

Jeol JEM-1400 Transmission Electron Microscope

Location: Room 1413



Model: Jeol JEM-1400 (Jeol Ltd., Tokyo, Japan)

Resolution (Line), nm: 0.20 

Resolution (Point), nm: 0.38 

Filament: Tungsten

Voltage, kV: 40-120

Magnification: x50 - x800,000



Equipped with:

  • Gatan Orius SC 1000B bottom mounted CCD-camera (Gatan Inc., USA)
  • Resolution: 4008 x 2672 pixels (9 µ each)
  • CCD active area: 36 x 24 mm
  • Scintilator: High-resolution phosphor
  • Binning: 1x, 2x, 3x, 4x
  • Dynamic range: 14-bit
  • Frame rate: 14 fps @ 4x binning full CCD area (1002 x 668 pixels) 30MHz dual port CCD readout
Hitachi HT7800

Hitachi HT7800 Transmission Electron Microscope

Location: Room 1407

Electron gun: Tungsten

Accelerating voltage: 20-120

Resolution: 0.204

Maximum magnification: x600 000

Main imaging camera

  • Model: Gatan Rio 9 (model 1809) bottom-mounted CMOS camera
  • Image size: 3072 x 3072 pixels
  • Pixel size: 9 um
Quanta FEG250 SEM

FEI Quanta 250 Field Emission Gun Scanning Electron Microscope

Location: Room 1409



Vacuum modes:

  • High vacuum
  • Low vacuum
  • Extended vacuum mode (ESEM) with cooling stage

Detectors:

  • Everhardt Thornley SED (secondary electron detector)
  • Large Field Low vacuum SED (LFD)
  • Gaseous SED (GSED) (used in ESEM mode)
  • vCD (low voltage high contrast detector)
  • BSED (back scattered electron detector)
  • Gatan BSED (used with 3View)

Equipped with the Gatan 3View system with the ability to obtain in situ 3D data at remarkably fine depth resolution by means of Serial Block-Face Scanning.
Zeiss Crossbeam 550 FIB-SEM

Zeiss Crossbeam 550 Field Emission Gun Scanning Electron Microscope equipped with Focus Ion Beam

Location: Room 1415

Zeiss Crossbeam 550 with GEMINI II electron optics is optimized for fast high-resolution low-kV imaging. The microscope is equipped with Gallium - Focused Ion Beam (FIB) for 3D EM imaging. It features a large chamber (330 mm inner diameter, 270 mm height) with 18 configurable ports for optional accessories, auto pendulum anti vibration system, 6-axes motorized super-eucentric stage, a plasma cleaner and charge compensation system.

Detectors:

  • In-chamber, Everhardt Thornley SE detector
  • In-chamber, retractable aBSD1 detector for backscattered electrons
  • In-Lens detectors for SE electrons
  • In-Lens EsB detector for backscattered electrons
  • Two in-chambers cameras
  • Navigation camera

Applications:

  • High resolution standard SEM imaging using low accelatating voltages
  • Imaging of large fields of view with an advanced stitching module
  • Imaging of poorly conductive specimens with low voltages or with the help of the charge compensation system
  • Isotropic and anisotropic 3D EM imaging with resolutions up to 4 x 4 x 4 nm and 2.5 x 2.5 x 5.0 nm