The resolution of conventional light microscopes (wide-field/confocal microscopes) is limited by the diffraction of light.
On a practical level, this is generally understood to set a theoretical limit for the horizontal resolution of a light microscope with a good objective to approximately half the wavelength of light used (so ca. 250 nm in green, 350 nm in deep red).
According to this interpretation of super-resolution the methods available at BIU are:
- Structured Illumination
- Enhances spatial resolution by superimposing a pattern of illumination on the imaged area and collecting a sequence of images while shifting the pattern. Knowledge of the pattern and shift is then used to collect high-frequency information from outside the observable region.
- XY resolution is approximately double that of a conventional light microscope (120 nm in green)
- Instruments at the BIU:
- Localization microscopy
- HyVolution & Lightning
- Confocal methods combining pinhole adjustment with advanced deconvolution
- XY resolution 140 nm
- Leica TCS SP8X
- Leica Stellaris 8
- Total Internal Reflection (TIRF)