In our Lab we use Secondary Ion Mass-Spectrometry (SIMS) and X-ray Photoelectron Spectroscopy (XPS) as powerful tools for analyzing material surfaces at the atomic and molecular level with high sensitivity to both trace element concentration and chemical state.
Ion implantation is employed for surface modification and producing reference standards for SIMS quantification of virtually any matrix-dopant combination.
Optically Detected Magnetic Resonance (ODMR) technique is being developed on the basis of confocal high-resolution microscopy for characterization of quantum technology materials and quantum sensing applications.
Cryogen-Free Dilution Refrigerator System installed in a shielded room is used for Positron Annihilation Spectroscopy (PAS) experiments at a temperature ranging from RT down to as low as ~10mK. The cryogenic system allows to perform transport measurements and electromagnetic characterization at ultra-low temperatures for studying of fundamental and applied aspects of nanosystems and nanostructured materials.
In the Laboratory for Nanomaterials the following experimental techniques are available:
Contact: Vladimir Tuboltsev (vladimir.tuboltsev@helsinki.fi)